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Conductors dielectrics and semiconductors

Learning objectives

  • Outcome

    Classify a sample as a conductor, dielectric, or semiconductor using its resistivity ρ\rho and band gap EgE_g.

  • Outcome

    Compute current density with the differential form of Ohm's law j=σEj=\sigma E and conductivity with the microscopic relation σ=neμ\sigma = n e \mu.

  • Outcome

    Compare a conductor and a semiconductor by carrier density nn and explain why the conductivity of a semiconductor grows with temperature.

  • Outcome

    Determine from the band gap the threshold wavelength of light that creates free carriers, and judge whether a material suits a photodetector.

Understand the idea

Conductors, Dielectrics and Semiconductors

Text

Solids differ first of all in how many of their electrons are free to move. In a conductor (a metal) the valence band overlaps the conduction band, so free carriers — electrons — are abundant, n∼1028 m−3n\sim10^{28}\ \text{m}^{-3}, and the resistivity is tiny: ρ∼10−8 Ω⋅m\rho\sim10^{-8}\ \Omega\cdot\text{m}. In a dielectric (insulator) the band gap is wide, Eg>3 eVE_g > 3\ \text{eV}, thermal motion hardly ever lifts electrons into the conduction band, ρ>108 Ω⋅m\rho > 10^{8}\ \Omega\cdot\text{m}, and a charge placed on an insulator stays where it is. A semiconductor has a narrow gap, Eg≈1 eVE_g \approx 1\ \text{eV} (silicon: 1.12 eV1.12\ \text{eV}), so a few carriers appear at room temperature, the conductivity lies between the two extremes, and it grows rapidly with temperature. For all three classes the local relation between field and current is Ohm's law in differential form, j⃗=σE⃗\vec{j} = \sigma \vec{E}, with σ=1/ρ\sigma = 1/\rho; microscopically σ=neμ\sigma = n e \mu, where nn is the carrier density and μ\mu the mobility. The classification is therefore quantitative: it is the carrier density nn (equivalently the band gap EgE_g) that decides whether a body conducts charge, stores it, or does something in between.

Worked examples

Direct

Problem

A bar of material has resistivity ρ=5.0×10−8 Ω⋅m\rho = 5.0\times10^{-8}\ \Omega\cdot\text{m}. An electric field E=0.10 V/mE = 0.10\ \text{V/m} is applied along it. (a) Classify the material. (b) Find the current density.

Solution

Step 1. Conductivity. σ=1/ρ=1/(5.0×10−8)=2.0×107 S/m\sigma = 1/\rho = 1/(5.0\times10^{-8}) = 2.0\times10^{7}\ \text{S/m}.

This is the order of a metal (107 S/m10^{7}\ \text{S/m}), so the material is a conductor.

Step 2. Current density. Differential form of Ohm's law:

j=σE=2.0×107 S/m×0.10 V/m=2.0×106 A/m2.j = \sigma E = 2.0\times10^{7}\ \text{S/m} \times 0.10\ \text{V/m} = 2.0\times10^{6}\ \text{A/m}^{2}.

Answer: conductor; j=2.0×106 A/m2j = 2.0\times10^{6}\ \text{A/m}^{2}.

Application

Problem

A semiconductor sample has electron density n=1.0×1022 m−3n = 1.0\times10^{22}\ \text{m}^{-3} and mobility μ=0.050 m2/(V⋅s)\mu = 0.050\ \text{m}^{2}/(\text{V}\cdot\text{s}).

(a) Find σ\sigma and ρ\rho.

(b) What is the electron drift velocity in a field E=100 V/mE = 100\ \text{V/m}?

(c) For copper n=8.5×1028 m−3n = 8.5\times10^{28}\ \text{m}^{-3}, μ=4.5×10−3 m2/(V⋅s)\mu = 4.5\times10^{-3}\ \text{m}^{2}/(\text{V}\cdot\text{s}). By what factor is copper's conductivity larger?

Solution

Step 1. Semiconductor conductivity.

σ=neμ=1.0×1022×1.6×10−19×0.050=80 S/m,\sigma = n e \mu = 1.0\times10^{22} \times 1.6\times10^{-19} \times 0.050 = 80\ \text{S/m},

ρ=1/σ=1.25×10−2 Ω⋅m.\rho = 1/\sigma = 1.25\times10^{-2}\ \Omega\cdot\text{m}.

This is the intermediate range — a semiconductor (between 10−810^{-8} and 108 Ω⋅m10^{8}\ \Omega\cdot\text{m}).

Step 2. Drift velocity.

vd=μE=0.050×100=5.0 m/s.v_{d} = \mu E = 0.050 \times 100 = 5.0\ \text{m/s}.

This drift speed is larger than in a metal; the charge is carried more weakly because the density nn is small.

Step 3. Comparison with copper.

σCu=8.5×1028×1.6×10−19×4.5×10−3=6.1×107 S/m,\sigma_{Cu} = 8.5\times10^{28} \times 1.6\times10^{-19} \times 4.5\times10^{-3} = 6.1\times10^{7}\ \text{S/m},

σCuσ=6.1×10780≈7.7×105.\frac{\sigma_{Cu}}{\sigma} = \frac{6.1\times10^{7}}{80} \approx 7.7\times10^{5}.

Answer: (a) σ=80 S/m\sigma = 80\ \text{S/m}, ρ=1.25×10−2 Ω⋅m\rho = 1.25\times10^{-2}\ \Omega\cdot\text{m}; (b) vd=5.0 m/sv_{d} = 5.0\ \text{m/s}; (c) about 7.7×1057.7\times10^{5} times larger.

Transfer

Problem

Band gaps: silicon Eg=1.12 eVE_g = 1.12\ \text{eV}, gallium arsenide Eg=1.42 eVE_g = 1.42\ \text{eV}, diamond Eg=5.5 eVE_g = 5.5\ \text{eV}. Using hc=1240 eV⋅nmhc = 1240\ \text{eV}\cdot\text{nm}, find the threshold (longest) wavelength of light able to create free carriers in each material. Which material suits a visible-light photodetector (400400–700 nm700\ \text{nm}), and how should diamond be classified at room temperature?

Solution

Step 1. Threshold wavelength. A free carrier appears when the photon energy E=hc/λE = hc/\lambda is at least EgE_g, i.e. λ≤λmax=hc/Eg\lambda \le \lambda_{max} = hc/E_g:

  • silicon: λmax=1240/1.12=1107 nm\lambda_{max} = 1240/1.12 = 1107\ \text{nm};
  • gallium arsenide: λmax=1240/1.42=873 nm\lambda_{max} = 1240/1.42 = 873\ \text{nm};
  • diamond: λmax=1240/5.5=225 nm\lambda_{max} = 1240/5.5 = 225\ \text{nm}.

Step 2. Comparison with visible light. Photons of 400400–700 nm700\ \text{nm} carry energies

E=1240700=1.77 eVandE=1240400=3.1 eV.E = \frac{1240}{700} = 1.77\ \text{eV} \quad \text{and} \quad E = \frac{1240}{400} = 3.1\ \text{eV}.

Both values exceed 1.12 eV1.12\ \text{eV} (Si) and 1.42 eV1.42\ \text{eV} (GaAs), so silicon and gallium arsenide respond to visible light. Diamond needs λ≤225 nm\lambda \le 225\ \text{nm} — deep ultraviolet — and is 'transparent' in the visible range.

Step 3. Classification. Since Eg=5.5 eV>3 eVE_g = 5.5\ \text{eV} > 3\ \text{eV}, diamond at room temperature is a dielectric: almost no carriers, ρ>108 Ω⋅m\rho > 10^{8}\ \Omega\cdot\text{m}.

Answer: λmax\lambda_{max} are 11071107, 873873 and 225 nm225\ \text{nm}; Si and GaAs suit visible light; diamond is a dielectric (UV only).

Practice

Text

Three experiments with a multimeter — battery-powered only (ohmmeter and diode-test modes), never connected to mains.

  1. Conductor. With a soft pencil draw a graphite strip about 6 cm6\ \text{cm} long on paper and measure its resistance RR. Repeat for L=2,4,6 cmL = 2, 4, 6\ \text{cm} and plot R(L)R(L): it is linear. Estimate σ=L/(RA)\sigma = L/(R A) and compare with the tabulated value for graphite.
  2. Dielectric. Measure RR of a dry glass rod, a plastic ruler and dry paper — the meter reads '> 20 MΩ20\ \text{M}\Omega' (off-scale). Then rub the plastic ruler with wool and check that a minute later it still attracts small paper bits: the charge does not leak away.
  3. Semiconductor. In diode-test mode measure the forward voltage drop of a silicon diode (about 0.60.6–0.7 V0.7\ \text{V}) and the reverse connection (off-scale). Warm the diode in your hand for 11–22 minutes and measure again: the forward drop decreases, because at higher temperature the carrier density rises and less voltage is needed for the same current.

If warming the device is inconvenient or unsafe, replace step 3 with any band-structure simulation (for example PhET 'Band Structure'): vary temperature and doping while recording the carrier density nn and the conductivity.

Results table: material — measured quantity — class (conductor / dielectric / semiconductor). Discuss why a conductor's resistance rises with temperature while a semiconductor's falls.

Visual reference

Purpose

Show how the band gap controls the number of free carriers and therefore fixes the class of a solid.

Representation

Sketch: three band diagrams side by side.

  • Conductor: the conduction and valence bands overlap, and the Fermi level lies inside the partly filled conduction band: almost all occupied electron states sit at or below the Fermi level, and above it there is only a narrow thermal layer of width of order kTkT containing a few excited electrons.
  • Semiconductor: gap Eg≈1 eVE_g \approx 1\ \text{eV}, only a few dots at the top, labelled 'thermal excitation'.
  • Dielectric: gap Eg>3 eVE_g > 3\ \text{eV}, conduction band empty.

Beneath the diagrams runs a shared logarithmic axis of resistivity ρ\rho in Ω⋅m\Omega\cdot\text{m}, marked 10−810^{-8} (metals), 10−510^{-5}–10410^{4} (semiconductors), >108>10^{8} (dielectrics). An arrow T↑T\uparrow at the semiconductor shows nn growing with temperature.

Real-world examples

Capacitive touchscreen of a smartphone

Scenario

A phone screen is a sheet of glass about 0.5 mm0.5\ \mathrm{mm} thick (relative permittivity εr≈6\varepsilon_r \approx 6), coated on the inside with a transparent conductor, indium tin oxide. When a fingertip (a conductor) comes within about 1 mm1\ \mathrm{mm} of the glass, the controller measures a change of capacitance of a few picofarads — for example from 20 pF20\ \mathrm{pF} to 19 pF19\ \mathrm{pF} — and registers a touch.

Connection

The glass is a dielectric: its charges are bound inside atoms and shift only by a fraction of an atomic size, so they polarize and support the field E=U/dE = U/d across the 0.5 mm0.5\ \mathrm{mm} thickness without carrying any steady current. The finger is a conductor: its free electrons rearrange in about 10−12 s10^{-12}\ \mathrm{s} so that the finger surface becomes an equipotential. The capacitance change comes from both kinds of behaviour at once.

Lightning striking a car body

Scenario

A lightning stroke carries a peak current of about 30 kA30\ \mathrm{kA} for a few tens of microseconds and transfers a charge of roughly 15 C15\ \mathrm{C}. The steel body of a parked car is about 0.8 mm0.8\ \mathrm{mm} thick. Passengers stay unhurt although the outer surface briefly reaches potentials of millions of volts relative to the ground.

Connection

Steel is a conductor with about one free electron per atom, number density n≈8.5×1028 m−3n \approx 8.5 \times 10^{28}\ \mathrm{m^{-3}}; these electrons move in about 10−6 s10^{-6}\ \mathrm{s} and place the excess charge on the outer surface. In electrostatic equilibrium the field inside the metal is zero, Ein=0E_\text{in} = 0, so the interior stays at one potential — a Faraday cage. The air around the car is a dielectric that normally carries no current and breaks down only when the field reaches its dielectric strength, about 3×106 V/m3 \times 10^{6}\ \mathrm{V/m}.

Rooftop silicon solar panel

Scenario

A household panel of area 1.6 m21.6\ \mathrm{m^2} delivers about 300 W300\ \mathrm{W} in sunlight of intensity 1000 W/m21000\ \mathrm{W/m^2}, with each cell giving about 0.6 V0.6\ \mathrm{V}. Its active material is crystalline silicon with band gap Eg=1.12 eVE_g = 1.12\ \mathrm{eV}; at 300 K300\ \mathrm{K} the number density of its own free carriers is only about 1.5×1016 m−31.5 \times 10^{16}\ \mathrm{m^{-3}}.

Connection

Silicon is a semiconductor: at room temperature it releases only about 1.5×10161.5 \times 10^{16} carriers per cubic metre, roughly twelve orders of magnitude fewer than the 8.5×1028 m−38.5 \times 10^{28}\ \mathrm{m^{-3}} of copper, and a carrier appears only when thermal motion or an absorbed photon supplies at least Eg=1.12 eVE_g = 1.12\ \mathrm{eV}. Adding one dopant atom per 10610^{6} silicon atoms raises the carrier number by many orders of magnitude without turning the material into a metal, which is what keeps it between the conductor and the dielectric.